Abstract: A leakage-tolerant design technique for high fan-in dynamic logic circuits is presented. An NMOS transistor with gate and drain terminals tied together (diode) is added in series with the ...

Abstract: The diagnosis of open-circuit (OC) faults has been well studied. However, it is necessary to further monitor the free-wheeling diodes (FWDs) in the OC leg, as their conduction affects the ...