针对FIB-SEM同步系统中离子束库仑力扩散与样品电荷积累导致的加工精度问题，研究人员开发了动态离子-电子中和器（SIEN）模型，通过GPU加速算法解析三维束流密度分布。实验表明，该模型使硅材料加工精度提升17%（30 pA FIB+5 keV EB），PMMA提升30%（80 pA FIB+3 keV EB ...

东京--(BUSINESS WIRE)--(美国商业资讯)--JEOL Ltd. (TOKYO:6951)（总裁兼首席执行官：Izumi Oi）宣布于2023年2月1日推出FIB-SEM系统“JIB-PS500i”。 随着先进材料结构愈发精细化和工艺愈发复杂化，形态观察、元素分析等评价技术对分辨率和精度提出了更高的要求。在半导体 ...

来自前沿领域的研究人员通过低温聚焦离子束-扫描电镜（cryo-FIB-SEM）技术，首次可视化水-四氢呋喃（THF）二元混合物在低温下的双连续相分离结构，发现FIB铣削导致THF富集区显著流失（局部升温约178 K），并揭示电子束诱导COPV2-G1纳米粒子形变与THF分解的耦合 ...

Today's scanning electron microscopes achieve ∼2-nm spot diameters at landing energies low enough that only the top few nanometers of the block's surface contributes substantially to the acquired ...

In this interview, AZoM speaks to Dr. Dean Miller, Senior Scientist at TESCAN Group, about how plasma FIB-SEM can be used to accelerate multi-modal materials characterization. FIB-SEM is based on a ...

ZEISS Crossbeam 750 FIB-SEM advances live, high-resolution “see while you mill” capability, providing unmatched feedback for precision endpointing in sample preparation workflows. · GlobeNewswire Inc.

Utilizing FIB-SEM, nanofluidic lab-on-a-chip devices for the analysis of single DNA molecules were characterized and fabricated. Direct FIB nanopatterning of silicon master stamps enables the quick ...

New ZEISS Gemini 4 electron optics offer superior resolution and signal-to-noise ratio Live SEM imaging extended to monitor rapid FIB milling down to ultrafine lamella polishing Largest undistorted ...

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